In Model-in-the-Loop for Embedded System Test (MiLEST) the developed signal-feature – oriented paradigm allows the abstract description of signals and their properties. It addresses the problem of missing reference signal flows as well as the issue of systematic test data selection. Numerous signal features are identified. Furthermore, predefined test patterns help build hierarchical test specifications, which enables a construc-tion of the test specification along modular divide-and-conquer principles. The processing of both discrete and continuous signals is possible, so that the hybrid behavior of embedded systems can be addressed.
The testing with MiLEST starts in the requirements phase and goes down to the test execution level. The essential steps in this test process are automated, such as the test data generation and test evaluation to name the most important.
Preliminary version. To be followed by the full version.